METHOD AND DEVICE FOR MEASURING OF A MATERIALS AGSORBING COEFFICIENT

摘要

Invention applies to optics and may be used for registering the material adsorption coefficient dependence on the wave length, temperature and other parameters. The invention aims to increase the precision of measurement of the material adsorption. The aim is achieved by the fact, that due to the proposed measurement method and the equipment all three quantities (l0 - light intensity directed onto the researched material, lτ - intensity of light passed through the researched material, lR - intensity of light reflected by the researched material) are measured together, and if the desired parameter changes an adsorption coefficient dependency on this parameter is set. The equipment itself consists of a monochromatic light source, an optical commutation device with the first mirror put in the way of the light source ray, in a way both outgoing rays form the above mentioned commutation device, and there are placed measuring chambers and a detector of light. In order to reverse the rays there are reflection prisms installed in each measuring chamber in the way of both rays. In the way of the ray between the reflection prisms, which directs the reflected ray form a sample to the detector, and the sample, the second mirror is placed.