发明名称 Removal of field and embedded metal by spin spray etching
摘要 A process of removing both the field metal, such as copper, and a metal, such as copper, embedded into a dielectric or substrate at substantially the same rate by dripping or spraying a suitable metal etchant onto a spinning wafer to etch the metal evenly on the entire surface of the wafer. By this process the field metal is etched away completely while etching of the metal inside patterned features in the dielectric at the same or a lesser rate. This process is dependent on the type of chemical etchant used, the concentration and the temperature of the solution, and also the rate of spin speed of the wafer during the etching. The process substantially reduces the metal removal time compared to mechanical polishing, for example, and can be carried out using significantly less expensive equipment.
申请公布号 US5486234(A) 申请公布日期 1996.01.23
申请号 US19950375054 申请日期 1995.01.19
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE UNITED STATES DEPARTMENT OF ENERGY 发明人 CONTOLINI, ROBERT J.;MAYER, STEVEN T.;TARTE, LISA A.
分类号 H01L21/3213;H01L21/768;(IPC1-7):H01L21/00 主分类号 H01L21/3213
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