发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE:To provide a semiconductor integrated circuit device, in which flip chip bonding can be carried out with high reliability, by detecting a defect in connection of a metallic bump easily. CONSTITUTION:An electrode connection gold bump 4 is formed on a mounting wiring board 2. A flip chip bonding step is carried out by using the electrode connection gold bump 4 to mount a semiconductor chip. At this time, a dummy gold bump 7 as high as the electrode connection gold bump 4 is formed near the semiconductor chip 6 on the mounting wiring board 2.
申请公布号 JPH0823011(A) 申请公布日期 1996.01.23
申请号 JP19940155029 申请日期 1994.07.06
申请人 HITACHI LTD;HITACHI VLSI ENG CORP 发明人 NISHIUMA MASAHIKO;SUWA MOTOHIRO;TAKAHASHI HIROYUKI;KAMATA CHIYOSHI
分类号 H01L21/60;H01L21/321;(IPC1-7):H01L21/60 主分类号 H01L21/60
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