发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
PURPOSE:To provide a semiconductor integrated circuit device, in which flip chip bonding can be carried out with high reliability, by detecting a defect in connection of a metallic bump easily. CONSTITUTION:An electrode connection gold bump 4 is formed on a mounting wiring board 2. A flip chip bonding step is carried out by using the electrode connection gold bump 4 to mount a semiconductor chip. At this time, a dummy gold bump 7 as high as the electrode connection gold bump 4 is formed near the semiconductor chip 6 on the mounting wiring board 2. |
申请公布号 |
JPH0823011(A) |
申请公布日期 |
1996.01.23 |
申请号 |
JP19940155029 |
申请日期 |
1994.07.06 |
申请人 |
HITACHI LTD;HITACHI VLSI ENG CORP |
发明人 |
NISHIUMA MASAHIKO;SUWA MOTOHIRO;TAKAHASHI HIROYUKI;KAMATA CHIYOSHI |
分类号 |
H01L21/60;H01L21/321;(IPC1-7):H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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