发明名称 DRAM having peripheral circuitry in which source-drain interconnection contact of a MOS transistor is made small by utilizing a pad layer and manufacturing method thereof
摘要 A MOS transistor included in a peripheral circuit of a DRAM has conductive layers for interconnection on respective surfaces of a pair of source.drain regions. The source.drain interconnection layers are electrically connected to the source.drain regions through the conductive layers. One of the pair of conductive layers is formed in the same step as a bit line of a memory cell, by the same material as the bit line. The other one of the pair of conductive layers is formed in the same step as a storage node of a capacitor of the memory cell, by using the same material as the storage node. The pair of conductive layers prevent direct connection between the source.drain interconnection layer and the source.drain regions, so that reduction in size of the source.drain regions can be realized.
申请公布号 US5486712(A) 申请公布日期 1996.01.23
申请号 US19940232315 申请日期 1994.04.25
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 ARIMA, HIDEAKI
分类号 H01L27/10;H01L21/8242;H01L27/105;H01L27/108;(IPC1-7):H01L27/108;H01L29/772 主分类号 H01L27/10
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