发明名称 |
OXYGEN ELIMINATION METHOD, POLLUTANT ELIMINATION METHOD, AND METHOD AND DEVICE FOR GROWING COMPOUND SEMICONDUCTOR DEVICE USING THEM |
摘要 |
PURPOSE:To provide a method for efficiently eliminating a pollutant on a semiconductor, especially oxide film. CONSTITUTION:When eliminating oxide film, hydrogen plasma and As molecular beams are applied, thus achieving an oxide elimination effect exceeding the combination of the oxide film elimination effect of hydrogen plasma and that of As molecular beams add eliminating the oxide film at a low temperature. |
申请公布号 |
JPH0817773(A) |
申请公布日期 |
1996.01.19 |
申请号 |
JP19940144604 |
申请日期 |
1994.06.27 |
申请人 |
CANON INC |
发明人 |
UCHIDA MAMORU |
分类号 |
H01L21/265;H01L21/20;H01L21/304;H01L21/306;H01L21/324;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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