FAILURE ANALYTIC MEMORY FOR LSI TESTER,申请号JP19940171910-传众专利搜索

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发明名称	FAILURE ANALYTIC MEMORY FOR LSI TESTER
摘要
申请公布号	JPH0815386(A)	申请公布日期	1996.01.19
申请号	JP19940171910	申请日期	1994.06.30
申请人	ADVANTEST CORP	发明人	TAKAHASHI KOJI;IIDA YOSUKE
分类号	G01R31/28;G01R31/00;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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