| 摘要 |
A system including a specifically-shaped probe and a complementarily-shaped hole formed in a surface of a part to be picked up ensures proper alignment between an end effector which picks up the part and the part itself. The probe includes first, second, third and fourth mutually converging locating surfaces terminating at a rounded tip at a free end of the probe. The probe is preferably diamond-shaped in cross-section along its entire length and the hole, consequently, is also diamond-shaped. The hole is defined by an inner peripheral diamond-shaped surface configured to be immediately adjacent and substantially parallel to each of the locating surfaces only when the end effector is in a proper pick up position and orientation with respect to the part. Preferably, the end effector is a gripper wherein the probe is adapted to be secured between gripping jaws of the gripper. In the preferred embodiment, the part comprises dunnage.
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