发明名称 Method of manufacturing semiconductor device
摘要 <p>In a method of manufacturing a semiconductor device, when contact holes are to be formed in an insulating film (110) formed on a monocrystalline or polycrystalline semiconductor layer (108), the contact holes can be formed using a polycrystalline semiconductor layer formed on the insulating film as a mask. Therefore, the lithographic step of forming the contact holes in the insulating film formed on the monocrystalline or polycrystalline semiconductor layer can be eliminated.</p>
申请公布号 EP0405500(B1) 申请公布日期 1996.01.17
申请号 EP19900112252 申请日期 1990.06.27
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HIRAKAWA, KENJI
分类号 H01L29/73;H01L21/285;H01L21/331;H01L21/768;H01L29/417;H01L29/732;(IPC1-7):H01L21/60 主分类号 H01L29/73
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