发明名称 METHOD AND DEVICE FOR MEASURING DISTRIBUTION OF SURFACE TEMPERATURE
摘要 <p>PURPOSE:To securely measure the distribution of the surface temperature of a material to be measured, which has a longitudinal shape and which is always continuously fed in the eccentric condition, by selecting a radiation thermometer, which measures the relatively accurate temperature, and accurately obtaining the surface temperature of a material to be measured opposite to the radiation thermometer lines on the basis of the temperature measurement data. CONSTITUTION:Radiation thermometers 11a-14e are arranged in the periphery of materials 30, 32 to be measured so as to form radiation thermometer lines 11-14, and a position detecting means 19 for detecting the relative position alpha, beta of the eccentric materials 30, 32 to be measured is arranged so as to detect the radiation thermometer, which is positioned nearest the center alpha, beta of the materials 30, 32 to be measured, and temperature distribution of the materials 30, 32 to be measured is, obtained by using the measurement data by radiation thermometers 11b, 12c, 13c and 14b.</p>
申请公布号 JPH085466(A) 申请公布日期 1996.01.12
申请号 JP19940135262 申请日期 1994.06.17
申请人 SUMITOMO METAL IND LTD 发明人 UEMATSU CHIHIRO;HIRAMOTO KAZUO
分类号 G01J5/10;B21C51/00;(IPC1-7):G01J5/10 主分类号 G01J5/10
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