发明名称 SECONDARY ION MASS ANALYZER
摘要 The secondary ion mass spectrometry is characterized in that a secondary ion generating part has a pulse voltage generator to generate a voltage in turns, and a spectrum may be an electrostatic spectrum capable of changing the direction of the electrode, or a magnetic spectrum having exits in two directions.
申请公布号 KR960000807(B1) 申请公布日期 1996.01.12
申请号 KR19920000154 申请日期 1992.01.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 MOON, HWAN - KOO;KIM, DONG - WON
分类号 G01N27/62;(IPC1-7):G01N27/62 主分类号 G01N27/62
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