发明名称 DISPLAY AND ITS CONNECTING STATE INSPECTION METHOD
摘要 PURPOSE:To surely inspect the connecting state of a flexible wiring plate with a common wiring board. CONSTITUTION:A first pad 44 for electric resistance inspection connected to first inspection terminals 42a, 42b is formed in a flexible wiring plate 32. A second pads 48a, 48b for electric resistance inspection connected to second inspection terminals 46a, 46b are formed in a common wiring board 33. In a mounted state, the first inspection terminals 42a, 42b are electrically connected to the second inspection terminals 46a, 46b, and electric resistance in the connected part is measured by bringing probes 56a, 56b into contact with each pad. A resistant value obtained is used to decide whether the connection state between the flexible wiring plate 32 and the common wiring board 33 is good or not.
申请公布号 JPH088023(A) 申请公布日期 1996.01.12
申请号 JP19940138911 申请日期 1994.06.21
申请人 SHARP CORP 发明人 FUJIKAWA HIDEAKI;NAGATA KATSUNORI;IIDA KAZUYA;MURAO MASAYUKI
分类号 G01R31/02;G01R27/00;H01R43/00;H05K1/02;H05K1/11;H05K3/36 主分类号 G01R31/02
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