发明名称 THREE-DIMENSIONAL SHAPE INSPECTION METHOD
摘要 PURPOSE:To determine a reference without spending much time and labor using a plurality of pieces of information even when they are obtained according to a pattern with a surface-shaped pattern and further improve measurement accuracy and obtain height information at a minute position. CONSTITUTION:A pattern is formed on a target to be inspected by a pattern projection means 90, the image of the target which is subjected to pattern projection by an image input means 91 is digitized and accumulated in an image memory, a pattern position is detected within each pattern detection range by a pattern position detection means 92, the position of a pattern detected by a conformity discrimination means 93 according to a neural network is input, and judgment is made by the neural network with the conformity judgment result as output.
申请公布号 JPH085348(A) 申请公布日期 1996.01.12
申请号 JP19940137241 申请日期 1994.06.20
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NAKAO SHINYA
分类号 G01B11/24;G06T1/00;G06T7/00 主分类号 G01B11/24
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