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发明名称
INSPECTION PROBE
摘要
申请公布号
JPH085662(A)
申请公布日期
1996.01.12
申请号
JP19940159281
申请日期
1994.06.16
申请人
SEIKEN:KK
发明人
SHIRATORI NOBUO
分类号
G01R1/073;G01R1/00;(IPC1-7):G01R1/073
主分类号
G01R1/073
代理机构
代理人
主权项
地址
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