发明名称 Probe adaptor for connecting integrated circuit components to electronic test-measurement appts.
摘要 The probe adapter (10) involves an IC component with an upper side mounted on a circuit board (50). The adapter has a probe lead arrangement (170) with a number of probe leads electrically connected to the connecting leads (104) of the IC component. A mechanical device (110,120,140,150) which engages the probe leads aligns the probe lead arrangement with the IC component to maintain a proper electrical connection between the connecting leads and the probe leads. The mechanical device contains an alignment element (110) coupled to a guide arrangement (120) for the probe leads, which are enclosed by a frame (140) attached to the guide arrangement. An adapter pcb. (150) attached to the frame is electrically connected to the probe leads.
申请公布号 DE19513275(A1) 申请公布日期 1996.01.11
申请号 DE19951013275 申请日期 1995.04.07
申请人 HEWLETT-PACKARD CO., PALO ALTO, CALIF., US 发明人 ZAMBORELLI, THOMAS J., COLORADO SPRINGS, COL., US;STEEN, MICHAEL J., COLORADO SPRINGS, COL., US
分类号 G01R31/26;G01R1/04;G01R1/073;H01L21/66;H01R33/76;(IPC1-7):G01R31/26;G01R31/28;H01R11/18 主分类号 G01R31/26
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