发明名称 ISOLATING METHOD OF SEMICONDUCTOR DEVICE
摘要 storing a pad oxide film and buffer layer on a semiconductor substrate; forming the first oxide prevention layer having pressure deformation on the buffer layer; forming a tensile deformation on the first oxide prevention layer; exposing the buffer layer of the device separation region by eliminating the first and the second oxide prevention layer; forming the device separation film by oxidating the semiconductor substrate of the exposed region.
申请公布号 KR960000700(B1) 申请公布日期 1996.01.11
申请号 KR19920014254 申请日期 1992.08.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YUN - KI
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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