发明名称 |
Automated diagnosis using wafer tracking databases |
摘要 |
A system and method for isolating one or more causes of wafer misprocessing. A list of interesting queries (10) is generated. During wafer processing (15), processing parameters are measured (20) and a wafer tracking database (25) is created. The list of queries (10) may be filtered (30) before the queries are tested for interestingness. Interestingness is determined by outlier calculation (35) and trend analysis (40) on data stored in the wafer tracking database (25). Queries found to be interesting are displayed (50).
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申请公布号 |
US5483636(A) |
申请公布日期 |
1996.01.09 |
申请号 |
US19950415081 |
申请日期 |
1995.03.29 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
SAXENA, SHARAD |
分类号 |
G05B23/02;H01L21/66;H01L23/544;(IPC1-7):H04J1/16;G06F11/34 |
主分类号 |
G05B23/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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