发明名称 |
METAL PLANERIZING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
forming a seed layer by executing the first sputtering process and by locating a wafer with a constant interval above the heater for lowering the temperature of the wafer less than that of the heater in the reaction chamber having the heater; forming flattening layer on the wafer by executing sputtering process and by locating the wafer on the heater for maintaining the temperature of the wafer and heater.
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申请公布号 |
KR960000371(B1) |
申请公布日期 |
1996.01.05 |
申请号 |
KR19920015305 |
申请日期 |
1992.08.25 |
申请人 |
LG SEMICONDUCTOR CO., LTD. |
发明人 |
KWAK, BYUNG - HO |
分类号 |
H01L21/285;(IPC1-7):H01L21/285 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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