发明名称 |
INTERLAYER INSULATING FILM STRUCTURE AND FORMING METHOD THEREOF |
摘要 |
The structure includes an impurity layer formed at the main surface of a semiconductor substrate; the first insulating layer between layers formed on the semiconductor substrate; a contacting part exposed on the impurity layer formed at the first insulating layer between layers; a conducting layer formed in the contacting part and on top of the first insulating layer; a spacer formed at the wall of conducting layer in the contacting; the second insulating layer between layers formed on the first insulating layer between layers, conducting layer and spacer.
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申请公布号 |
KR960000377(B1) |
申请公布日期 |
1996.01.05 |
申请号 |
KR19920015488 |
申请日期 |
1992.08.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JIN - HONG;SONG, CHANG - YONG |
分类号 |
H01L21/312;(IPC1-7):H01L21/312 |
主分类号 |
H01L21/312 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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