发明名称 INTERLAYER INSULATING FILM STRUCTURE AND FORMING METHOD THEREOF
摘要 The structure includes an impurity layer formed at the main surface of a semiconductor substrate; the first insulating layer between layers formed on the semiconductor substrate; a contacting part exposed on the impurity layer formed at the first insulating layer between layers; a conducting layer formed in the contacting part and on top of the first insulating layer; a spacer formed at the wall of conducting layer in the contacting; the second insulating layer between layers formed on the first insulating layer between layers, conducting layer and spacer.
申请公布号 KR960000377(B1) 申请公布日期 1996.01.05
申请号 KR19920015488 申请日期 1992.08.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JIN - HONG;SONG, CHANG - YONG
分类号 H01L21/312;(IPC1-7):H01L21/312 主分类号 H01L21/312
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