发明名称 Component transport system for integrated circuit testing unit
摘要 The system includes a test tray (180), supply (174) and change (175) mechanisms, and a reception carrier section (112). The supply and change mechanisms transport a user tray (170) to a tray change section (173) to transfer IC components to the test tray as a first component supply side. The reception carrier section transports the components from a supply magazine transport mechanism (154). Through the magazine transport mechanism, a bar shaped magazine (150) is transported to a test tray transport section (114) as a second component supply side. The test tray transport section works such that the components for transfer are transferred from the reception carrier section to the tray change section. After that the components are transported to the test tray. The component transport system can be used for the container construction of the tray type magazine and the bar shaped magazine.
申请公布号 DE19523969(A1) 申请公布日期 1996.01.04
申请号 DE19951023969 申请日期 1995.06.30
申请人 ADVANTEST CORP., TOKIO/TOKYO, JP 发明人 NAKAMURA, HIROTO, KAZO, SAITAMA, JP;SUZUKI, KATSUHIKO, MEIWA, GUNMA, JP;KOBAYASHI, YOSHIHITO, GYODA, SAITAMA, JP
分类号 G01R31/01;G01R31/28;H01L21/00;H05K13/08;(IPC1-7):B65G49/05;G01R31/26;H01L21/66;H01L21/68 主分类号 G01R31/01
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