发明名称 |
Process for deposition of a tungsten layer on a semi-conductor wafer |
摘要 |
<p>A process is disclosed for the deposition of a layer of tungsten on a semiconductor wafer in a vacuum chamber wherein the improvement comprises forming an insulating layer on said wafer over an integrated circuit structure formed on said wafer, forming an intermediate layer of titanium nitride over said insulating layer, forming a cvd tungsten nucleation layer over said intermediate layer of titanium nitride, and depositing tungsten on said nucleation layer. <IMAGE></p> |
申请公布号 |
EP0689231(A2) |
申请公布日期 |
1995.12.27 |
申请号 |
EP19950114144 |
申请日期 |
1990.08.24 |
申请人 |
APPLIED MATERIALS INC. |
发明人 |
CHANG, MEI;LEUNG, CISSY;WANG, DAVID NIN-KOU;CHENG, DAVID |
分类号 |
C23C16/06;C23C16/08;C23C16/22;C23C16/44;H01L21/28;H01L21/285;H01L21/3205;H01L21/768;(IPC1-7):H01L21/285 |
主分类号 |
C23C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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