| 摘要 |
In the proposed x-ray fluorescence spectrometer, the x-ray tube (1) is aligned with the specimen holder (3) in such a way that the maximum illumination of the surface of the specimen (4) at a tube voltage of 50 kV is not less than 15 Z erg/s cm<2> watt, Z being the atomic number of the anode material in the x-ray source, and the distance r from the inlet slit (7) to the specimen radiation sampling centre (O) is given by the formula r </= hD/L, where h is the distance between the focal point (F) of the tube (1) and the specimen (4), D is the diameter of the focal region (6) and L is the length of the crystal analyser (5). To improve the spectrometer transmission by reducing the distance h while ensuring that the measurement results can still be reproduced, the angle beta between the line (FM) connecting the focal point (F) of the tube (1) with the point of maximum illumination on the surface of the specimen (4) and the line (FO) connecting the focal point (F) of the tube (1) with the centre (O) of the specimen radiation sampling zone is equal to [(0.6-1.5) L/D - gamma ], where gamma is the angle of inclination of the end face of the tube (1) in relation to the surface of the specimen (4); and the angle phi between the line (FO) and the line (10) through the inlet slit (7) and the centre of the crystal analyser (5) is equal to (0.8-1.2) pi /2. |
