EMI MEASURING TABLE USING TEM CELL

摘要

The tested material support for an EMI measurement using TEM cell comprises: a first supporting member placed inside of the TEM cell; a first fixing supporting unit which is supported by the first supporting member and has round shape grooves at its upper side; a Y axis centering rotation unit which has a first tested material rotation unit which is fixed to the round shape grooves of the first fixing supporting unit and has a plurality of fixing grooves and thus controls the centering point of the tested material to be fixed to the center between an internal conductor and an external conductor; a second supporting member inserted to the fixing grooves of the Y axis centering rotation unit; a second fixing supporting unit which is supported by a second supporting member and has round shape grooves at its upper side; a centering axis changing unit which has a second tested material rotation unit which is fixed to the round shape grooves of the second fixing supporting unit and has a plurality of rotation plate fixing grooves and performs a phase change according to the change of a centering axis of each tested material required at the EMI measurement.