| 摘要 |
a tested material region which is formed to be a cube shape and has a plurality of supporting bars therein; a trapezoid shape of taper region which has a first taper radius connected to a boundary surface of the tested material region and formed to be a curve to suppress the generation of a flanged wave and a second taper radius which is diagonally connected to the first curve radius and is formed to be a curve to suppress a reflective wave at its maximum, the right and left width of the taper region being increased at a constant rate; a coaxal connector joint region which is connected between a connector and the end of a taper region and has a cubic shape of connector joint to which a flange is placed to connect and separate the taper region; an internal septum one side of which is inserted to the connector joint, which is placed inside of the tested material region to be supported by the supporting bar and forms an electric field between the tested material region and an external conductor plate; and an opening/shutting unit having shield windows at the upper and lower sides to observe the operation of the tested material.
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