发明名称 |
Method of manufacturing solid state image sensing device |
摘要 |
An aluminum film (10a) for covering an interlayer insulating film (9) is formed by sputtering, and is then subjected to a heat treatment at a temperature lower than its melting point to cause a reflow. Then, an opening (11a) is formed in the aluminum film, so that a light shielding film is formed in such a way as to cover the step portion with a uniform thickness. Making the light shielding film (10a) of a solid state image sensing device thinner permits the opening size of the light shielding film to increase, ensures the effective use of light to improve the sensitivity, and improves the working precision in forming the opening, thus suppressing a variation in the sensitivity of the individual pixels. <IMAGE> |
申请公布号 |
EP0687017(A1) |
申请公布日期 |
1995.12.13 |
申请号 |
EP19950108402 |
申请日期 |
1995.05.31 |
申请人 |
NEC CORPORATION |
发明人 |
HATANO, KEISUKE, C/O NEC CORPORATION;MINAMI, KAZUMA, C/O NEC CORPORATION |
分类号 |
H01L27/148;H01L21/203;H01L31/0216 |
主分类号 |
H01L27/148 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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