发明名称 ISOLATION FILM OF SEMICONDUCTOR DEVICE, COATING FLUID FOR FORMING THE FILM, AND PROCESS FOR PRODUCING THE FILM
摘要 <p>An insulation film of semiconductor devices, which has a good film quality and excellent burying characteristics and is capable of thick coating and leveling. An insulation film (6) comprising a silane compound of the general formula SiHx(CH3)yO2-(x+y)/2 (wherein 0 &lt; x &lt; 1 , 0 &lt; y &lt; 1 and x+y &lt;/= 1 ) is formed by coating a stepped semiconductor substrate (1) with a coating fluid for forming insulation films mainly comprising a solution of a polymer prepared by cohydrolyzing a trialkoxysilane of the general formula SiH(OR)3, a methyltrialkoxysilane of the general formula SiCH3(OR)3 and a tetraalkoxysilane of the general formula Si(OR)4, drying the coating, and curing the same by heating in an inert gas atmosphere.</p>
申请公布号 EP0686680(A1) 申请公布日期 1995.12.13
申请号 EP19950903964 申请日期 1994.12.27
申请人 KAWASAKI STEEL CORPORATION 发明人 NAKANO, TADASHI, TECHNICAL RESEARCH DIVISION,;TOKUNAGA, KYOJI, TECHNICAL RESEARCH DIVISION,
分类号 C09D183/04;C09D183/05;H01L21/316;(IPC1-7):C09D183/05;H01L21/312 主分类号 C09D183/04
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