<p>Seed skipping means are provided for use in conjunction with a linear feedback shift register used as a pseudo-random pattern generator for generating sequences of test bit streams for testing integrated circuit devices. The utilization of seed skipping means for the pseudo-random pattern number generator in connection with weighting of the patterns from the random pattern generator provides an effective and low cost solution to data storage problems associated with generating effective test patterns for testing integrated circuit chip devices. <IMAGE></p>
申请公布号
DE69114183(D1)
申请公布日期
1995.12.07
申请号
DE1991614183
申请日期
1991.02.06
申请人
INTERNATIONAL BUSINESS MACHINES CORP., ARMONK, N.Y., US
发明人
KOENEMANN, BERND KARL FERDINAND, HOPEWELL JUNCTION, N. Y. 12533, US