Connector assembly for chip testing.

摘要

An electrical connector is described for making contact with a plurality of convex and deformable contacts (40, 46) on an electronic device (38). The electrical connector comprises a substrate having a plurality of conductors (10, 12, 14) which extend above its surface. A polymeric material (20) is disposed on the surface of the substrate and has openings which expose the conductors, each opening sized to receive one of the convex, deformable contacts, and to enable electrical connection between the exposed conductors and the deformable contacts. A mechanism is provided for urging the deformable contacts on the electronic device against the exposed conductors. The mechanism exerts sufficient force between the device and the conductors to cause some deformation of the convex contact areas by the conductors. <IMAGE>