发明名称 Method of forming a polysilicon-on-silicide capacitor
摘要 A method produces a capacitor. On a substrate, a first polysilicon layer is formed over an insulating region. A metal-silicide layer is formed on top of the first polysilicon layer. A dielectric layer is formed on top of the metal-silicide layer. A second polysilicon layer is formed on top of the dielectric layer. The second polysilicon layer and the dielectric layer are etched to form a top electrode and dielectric region. The metal-silicide layer and the first polysilicon layer are etched to form a bottom electrode.
申请公布号 US5470775(A) 申请公布日期 1995.11.28
申请号 US19930149085 申请日期 1993.11.09
申请人 VLSI TECHNOLOGY, INC. 发明人 NARIANI, SUBHASH R.
分类号 H01L21/02;(IPC1-7):H01L27/00;H01L21/70 主分类号 H01L21/02
代理机构 代理人
主权项
地址