发明名称 Apparatus and method for the analysis of particle characteristics using monotonically scattered light
摘要 PCT No. PCT/GB93/00337 Sec. 371 Date Jul. 29, 1994 Sec. 102(e) Date Jul. 29, 1994 PCT Filed Feb. 18, 1993 PCT Pub. No. WO93/17322 PCT Pub. Date Sep. 2, 1993.An apparatus for the analysis of individual particle characteristics from an aerosol or other suspension of particles, of the type having a scattering chamber (15) with an ellipsoidal reflector (17) and an orifice leading to a rear chamber (20), and a monochromatic light source (10) adapted to transmit a collimated beam of light (11) along the main axis of the reflector (17) to impinge on a stream of the particles reflector (17), has an optical system (17, 32, 33, 34) arranged to collect light back-scattered from a particle, through a solid angle of at least 3 pi , pass the light to a a ccd video recorder (36) having a two dimensional array of a multitude of sensors. The recorder (36) is associated with a data processor (37) and with an imaging screen (35) positioned such that rays of light scattered from the particle and imaged thereon by the optical system (17, 32, 33, 34) are monotonically ordered with respect to the angle of scattering of the rays from the particle.
申请公布号 US5471299(A) 申请公布日期 1995.11.28
申请号 US19940256983 申请日期 1994.07.29
申请人 THE SECRETARY OF STATE FOR DEFENCE IN HER BRITANNIC MAJESTY'S GOVERNMENT OF THE UNITED KINGDOM OF GREAT BRITAIN AND NORTHERN IRELAND 发明人 KAYE, PAUL H.;HIRST, EDWIN
分类号 G01J1/44;G01N15/00;G01N15/02;G01N15/14;(IPC1-7):G01N15/02 主分类号 G01J1/44
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