发明名称 |
MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
PURPOSE:To simplify a process for forming a twin well on a semiconductor substrate. CONSTITUTION:After p-type impurity ions are implanted into the entire surface of a semiconductor substrate 1, photoresist 4 covering a region for forming p-type well is masked and n-type implurity ions are implanted selectively into the semiconductor substrate 1 of the n-type well formation region and the semiconductor substrate is heat-treated to extend and diffuse the n-type impurity and p-type impurity. After that, with the photo,resist 4 as a mask, the surface of the semiconductor substrate 1 is partially etched to form an alignment mark 5. |
申请公布号 |
JPH07312391(A) |
申请公布日期 |
1995.11.28 |
申请号 |
JP19940105152 |
申请日期 |
1994.05.19 |
申请人 |
HITACHI LTD;HITACHI VLSI ENG CORP;HITACHI HOKKAI SEMICONDUCTOR LTD;HITACHI INSTR ENG CO LTD |
发明人 |
YOU REISHI;YOSHIDA MITSUHIKO;WATABE KOZO;FUJIOKA YASUHIDE;KANEKO YOSHIYUKI;SOEDA KOKI;OGISHIMA JUNJI |
分类号 |
H01L21/761;H01L21/027;H01L21/266;H01L21/316;H01L21/318;H01L21/8238;H01L27/092;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/761 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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