发明名称 Sheet flatness measurement system and method
摘要 A sheet flatness measuring system consists of a frame carrying a structured illumination system for producing illumination beneath the frame in a periodic pattern of opaque and illuminated lines. A flat base or table, having a surface parallel to the structured illumination system, is placed beneath the structured illumination system to be illuminated by it. A sheet of reflective or semi-reflective material, the flatness of which is to be measured, is placed on the table. The reflection of the structured illumination is viewed from the sheet a by video camera, typically mounted in a central location above the center of the table on which the sheet is placed. The structured illumination pattern is moved to different positions, and multiple video images are digitized and compared in a computer to calculate the local slope at each point or pixel in the image of the sheet viewed by the camera. From this slope information, the computer derives an output representative of variations in the surface flatness of the sheet undergoing measurement.
申请公布号 US5471307(A) 申请公布日期 1995.11.28
申请号 US19920947389 申请日期 1992.09.21
申请人 PHASE SHIFT TECHNOLOGY, INC. 发明人 KOLIOPOULOS, CHRIS L.;TANG, SHOUHONG
分类号 G01B11/30;(IPC1-7):G01B11/30 主分类号 G01B11/30
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