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发明名称
Method of testing a circuit, and circuit suitable for such a method.
摘要
申请公布号
EP0380161(B1)
申请公布日期
1995.11.22
申请号
EP19900200118
申请日期
1990.01.17
申请人
PHILIPS ELECTRONICS N.V.
发明人
VAN DER STAR, MAX
分类号
G01R31/28;G01R31/3185;G06F11/22;(IPC1-7):G06F11/26
主分类号
G01R31/28
代理机构
代理人
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地址
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