发明名称 Integrated circuit test system
摘要 An integrated circuit test system provides a quick change flexible circuit membrane (214). The flexible circuit membrane is a quadrant based design which allows steep launch angles away from a rectangular die under test (112). The flexible circuit membrane is edge guided (308,309) for positioning and concentric alignment in a probe tooling fixture (212). The system may include a focusing force member (528) focusing force only at the test point locations in line with the die pad contact positions (512) which allows greater force to be concentrated on the contact area, and helps to alleviate the debris tracking or "dust mop" effect. Additionally, a relieved area (620) may be provided on the pressure applicator (616) to prevent membrane droop or the pillowing effects.
申请公布号 US5469072(A) 申请公布日期 1995.11.21
申请号 US19930143770 申请日期 1993.11.01
申请人 MOTOROLA, INC. 发明人 WILLIAMS, WILLIAM M.;ANGELO, ANTHONY;WESTBROOK, GREGORY L.
分类号 G01R1/073;(IPC1-7):G01R1/073 主分类号 G01R1/073
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