| 摘要 |
<p>PURPOSE:To provide an IC card checking method which can effectively use the initial defect information without destroying this information stored in a flush EEPROM. CONSTITUTION:The initial defect information on a flush EEPROM is stored in a 2nd storage area 13b of an attribute memory 13. Then the erasing/writing operations of the EEPROM are checked by writing a test data pattern. Thus the assembly state such as a contact defect and the memory operation can be checked without destroying the initial defect information. This information is updated based on the checking result, and a defective block table is produced based on the updated initial defect information. The defective block table is stored in the memory 13 as a part of the card attribute information.</p> |
