发明名称 |
Electrical assembly testing using robotic positioning of probes |
摘要 |
The present invention is an improved printed circuit board test system in which test probes are positioned to electronically engage a selected device or printed circuit board section on a printed circuit board for testing the printed circuit board for manufacturing defects. The printed circuit board test system uses a bed-of-nails test fixture to ground and excite predetermined sites on a first side of the printed circuit board and a robot to mechanically position test probe(s) at selected test sites on a second side of the printed circuit board. A controller is used to control the movement of the robotic tester and the selection of spring probes in the bed-of-nails fixture to be exited, grounded or measured.
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申请公布号 |
US5469064(A) |
申请公布日期 |
1995.11.21 |
申请号 |
US19930122031 |
申请日期 |
1993.09.15 |
申请人 |
HEWLETT-PACKARD COMPANY |
发明人 |
KERSCHNER, RONALD K.;HEUMANN, JOHN M.;MCDERMID, JOHN E.;SCHLOTZHAUER, ED. O.;CROOK, DAVID T. |
分类号 |
G01R1/06;F02P17/00;G01R1/067;G01R1/07;G01R31/02;G01R31/26;G01R31/28;G01R31/302;G01R31/312;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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