发明名称 INSPECTION JIG BOARD FOR SEMICONDUCTOR PACKAGE AND METAL BASE SUBSTRATE
摘要 PURPOSE:To provide a low-cost small inspecting jig board, having high contact reliability, which can be used when inspecting the electric characteristics of a semiconductor package (BGA package and the like) having protruding external connection section. CONSTITUTION:A semi-spherical recessed part 14 is formed on a metal plate 11 by press forming using a metal base board having a circuit-processed copper foil layer 13 through an insulating layer 12. The recessed part 14 is provided on the position opposing to the external connection section of a semiconductor package. One end of the circuit-processed copper foil layer 13 is exposed to a wiring pattern, and the other end is used as the connection pad part 15 for connection with an external part. The recessed part 14 and the external connection section of the package 15 are coincided and brought in contact with each other, and their electrical contact is obtained accurately.
申请公布号 JPH07307537(A) 申请公布日期 1995.11.21
申请号 JP19940100994 申请日期 1994.05.16
申请人 MITSUI TOATSU CHEM INC 发明人 NAGAMINE KUNIHIRO;TAKAHASHI SEIICHI;ISHIGAKI KYOICHI;HOSHINO TATSUMI
分类号 H01L21/66;H01R4/58;H05K1/05;H05K3/00;H05K13/08 主分类号 H01L21/66
代理机构 代理人
主权项
地址