发明名称 DRAM CELL MANUFACTURING PROCESS
摘要 The method for manufacturing a capacitor for a semiconductor memory device comprises the steps of: depositing a first insulating layer over a conductive layer with a prominence and depression surface and etching back to leave the first insulating layer only at a part of the conductive layer; anisotropic-etching the conductive layer by using the first insulating layer as a mask and forming a second prominence and depression thereover; depositing a second insulating layer over the conductive layer; etching back the second insulating layer to leave the second insulating layer only at a part of the conductive layer; and etching the conductive layer by using the remaining second insulating layer as a mask and forming a third prominence and depression thereover.
申请公布号 KR950013904(B1) 申请公布日期 1995.11.17
申请号 KR19920002129 申请日期 1992.02.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIM, SANG - PIL
分类号 H01L27/04;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/04
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