发明名称 |
Multilayer gate MOS device. |
摘要 |
A semiconductor device comprises a semiconductor substrate of a first conductivity type, a first conductive layer such as a polysilicon layer (44) formed on the semiconductor substrate using a dopant, of a second conductivity type, a silicon-rich nitride film (48) formed on the first conductive layer, and a second conductive layer (50) such as a refractory metal or metal silicide layer formed on the silicon-rich nitride film, wherein the silicon-rich nitride film inhibits outdiffusion of dopant from the first conductive layer into the second conductive layer, and blocks interdiffusion between the second conductive layer and the first conductive layer. <IMAGE> |
申请公布号 |
EP0682359(A1) |
申请公布日期 |
1995.11.15 |
申请号 |
EP19950480044 |
申请日期 |
1995.05.09 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HUNTER, THOMAS;MORTON, JOSEPH M.;SHORE, SUSAN EILEEN;YU, ANTHONY J. |
分类号 |
H01L21/283;H01L21/28;H01L21/285;H01L21/8238;H01L27/092;H01L29/43;H01L29/78 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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