发明名称 |
Particle measuring apparatus and particle measuring method by the apparatus. |
摘要 |
<p>Particle measuring apparatus 1 comprising slide plate 3 set between tanks 2a and 2b and having through-holes 8 to 11 passing through slide plate 3 and a pair of electrodes 4a and 4b, wherein through-holes 8 to 11 on slide plate 3 are formed by a group of through-holes with different diameters. When one of the through-holes 8 to 11 is brought to a position corresponding to connective holes 2c and 2d by driving unit 7, particle distribution is measured and analyzed in accordance with the electrical impedance when a sample suspension passes through the through-hole. <IMAGE></p> |
申请公布号 |
EP0682241(A1) |
申请公布日期 |
1995.11.15 |
申请号 |
EP19950401030 |
申请日期 |
1995.05.04 |
申请人 |
TOA MEDICAL ELECTRONICS CO., LTD. |
发明人 |
OGINO, SHINICHI |
分类号 |
G01N15/12;(IPC1-7):G01N15/12 |
主分类号 |
G01N15/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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