发明名称 Particle measuring apparatus and particle measuring method by the apparatus.
摘要 <p>Particle measuring apparatus 1 comprising slide plate 3 set between tanks 2a and 2b and having through-holes 8 to 11 passing through slide plate 3 and a pair of electrodes 4a and 4b, wherein through-holes 8 to 11 on slide plate 3 are formed by a group of through-holes with different diameters. When one of the through-holes 8 to 11 is brought to a position corresponding to connective holes 2c and 2d by driving unit 7, particle distribution is measured and analyzed in accordance with the electrical impedance when a sample suspension passes through the through-hole. &lt;IMAGE&gt;</p>
申请公布号 EP0682241(A1) 申请公布日期 1995.11.15
申请号 EP19950401030 申请日期 1995.05.04
申请人 TOA MEDICAL ELECTRONICS CO., LTD. 发明人 OGINO, SHINICHI
分类号 G01N15/12;(IPC1-7):G01N15/12 主分类号 G01N15/12
代理机构 代理人
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