发明名称 Method of and an apparatus for measuring surface contour
摘要 A measurement-datum similar to profile of a measuring object set in a measuring area in which a detector and the measuring object are moved relatively is formed to measure the displacement value between the detector and the measuring object through the relative movement based on the measurement-datum to thereby compute the surface contour of the measuring object from the measured data with reference to the measurement-datum. Since the measurement-datum is set in the spatial area, a precise mechanical processing will not be required for an accurate measurement of the measuring object having a strange profile which was not measured by conventional apparatus.
申请公布号 US5467289(A) 申请公布日期 1995.11.14
申请号 US19930134915 申请日期 1993.10.12
申请人 MITUTOYO CORPORATION 发明人 ABE, MAKOTO;OHTA, SHIGEKATA;TOKITOH, HIROYUKI;UEDA, MORIMASA;KANO, TAKAHUMI;HIDAKA, HIROYUKI
分类号 G01B21/04;(IPC1-7):G01B5/008 主分类号 G01B21/04
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