发明名称 |
Method of and an apparatus for measuring surface contour |
摘要 |
A measurement-datum similar to profile of a measuring object set in a measuring area in which a detector and the measuring object are moved relatively is formed to measure the displacement value between the detector and the measuring object through the relative movement based on the measurement-datum to thereby compute the surface contour of the measuring object from the measured data with reference to the measurement-datum. Since the measurement-datum is set in the spatial area, a precise mechanical processing will not be required for an accurate measurement of the measuring object having a strange profile which was not measured by conventional apparatus.
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申请公布号 |
US5467289(A) |
申请公布日期 |
1995.11.14 |
申请号 |
US19930134915 |
申请日期 |
1993.10.12 |
申请人 |
MITUTOYO CORPORATION |
发明人 |
ABE, MAKOTO;OHTA, SHIGEKATA;TOKITOH, HIROYUKI;UEDA, MORIMASA;KANO, TAKAHUMI;HIDAKA, HIROYUKI |
分类号 |
G01B21/04;(IPC1-7):G01B5/008 |
主分类号 |
G01B21/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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