APPARATUS FOR MEASURING CRITICAL CURRENT OF SUPERCONDUCTOR LAID UNDER CRYOGENIC MAGNETIC FIELD,申请号KR1019930024663-传众专利搜索

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发明名称	APPARATUS FOR MEASURING CRITICAL CURRENT OF SUPERCONDUCTOR LAID UNDER CRYOGENIC MAGNETIC FIELD
摘要
申请公布号	KR1019950013608(B1)	申请公布日期	1995.11.13
申请号	KR1019930024663	申请日期	1993.11.18
申请人		发明人
分类号		主分类号
代理机构		代理人
主权项
地址

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