发明名称 LOW-VOLTAGE MEMORY
摘要 PURPOSE: To provide a low voltage EEPROM cell having a long data storing time, by inserting a thin floating gate having a different energy and edge from that of a channel region into a gate stack of the N-channel EEPROM. CONSTITUTION: An N-channel EEPROM element is comprised of a material having a conductive band edge of a floating gate 10 with lower than 1 kT electron volt at least than a conductive band edge of a channel region 4 (or Fermi energy in case of metal or compound material including metal). Therefore, the flowing gate material has a larger electronic affinity than the material of the channel region. As a result, an insulating layer 112 which separates the floating gate from the channel can be formed thin (less than 100Å), a writing voltage is reduced and a writing cycle number which is performed without failure is increased. Also, during readout operation charges stored in the floating gate can not be returned to the channel region caused by the tunnel operation.
申请公布号 JPH07302848(A) 申请公布日期 1995.11.14
申请号 JP19950031981 申请日期 1995.02.21
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 ARAN EMU HAATOSUTEIN;MAIKERU EI CHISUCHIRAA;SANDEITSUPU CHIWARI
分类号 H01L21/8247;H01L29/49;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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