发明名称 |
TEST STRIP OVERTURNING MECHANISM IN AUTOMATED ANALYZER |
摘要 |
Disclosed is a test strip overturning mechanism in an automated analyzer for arranging test strips such that the right sides thereof may face in one direction, which comprises: an overturning device having an arm portion with suction holes being formed thereon; and a motor connected to the overturning device via a rotary shaft, wherein the suction holes formed on the arm portion are aligned in a straight line with suction holes formed on a transportation stage, arranged in the direction orthogonal to the direction that the test strips are moved; and a turntable is disposed at the position corresponding to the location of the arm portion when the overturning device is turned 180.degree. round the rotary shaft. |
申请公布号 |
CA2148636(A1) |
申请公布日期 |
1995.11.11 |
申请号 |
CA19952148636 |
申请日期 |
1995.05.04 |
申请人 |
BAYER CORPORATION |
发明人 |
YOKOTA, HIROSHI;TAKAHASHI, KEIJI |
分类号 |
G01N35/04;G01N35/00;(IPC1-7):G01N35/00 |
主分类号 |
G01N35/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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