发明名称 TEST STRIP OVERTURNING MECHANISM IN AUTOMATED ANALYZER
摘要 Disclosed is a test strip overturning mechanism in an automated analyzer for arranging test strips such that the right sides thereof may face in one direction, which comprises: an overturning device having an arm portion with suction holes being formed thereon; and a motor connected to the overturning device via a rotary shaft, wherein the suction holes formed on the arm portion are aligned in a straight line with suction holes formed on a transportation stage, arranged in the direction orthogonal to the direction that the test strips are moved; and a turntable is disposed at the position corresponding to the location of the arm portion when the overturning device is turned 180.degree. round the rotary shaft.
申请公布号 CA2148636(A1) 申请公布日期 1995.11.11
申请号 CA19952148636 申请日期 1995.05.04
申请人 BAYER CORPORATION 发明人 YOKOTA, HIROSHI;TAKAHASHI, KEIJI
分类号 G01N35/04;G01N35/00;(IPC1-7):G01N35/00 主分类号 G01N35/04
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