发明名称 THIN FILM TRANSISTOR AND ITS MANUFACTURE
摘要 <p>PURPOSE:To reduce the overlapping capacitance between a gate electrode and drain electrode by providing an active layer area having the same width as the gate electrode has on a gate insulating layer and the source and drain electrode sections of a metal silicide layer formed in such a state that the electrode sections are connected to both eternal surfaces of the active layer area. CONSTITUTION:A channel protective layer area 14 is formed on a gate electrode 2 provided on an active layer area 13 so that the area 14 has the same width as the electrode 2 has. Then a source electrode section 15 and drain electrode section 16 composed of a metal silicide are connected to both outer walls of the thick part of the active layer area 13. Since the electrodes 15 and 16 are formed just outside of the gate electrode 2 on the electrode 2, the source and drain electrodes 15 and 16 do not overlap the electrode 2 and the overlapping capacitance Cgd between the gate electrode and drain electrode can be reduced.</p>
申请公布号 JPH07297405(A) 申请公布日期 1995.11.10
申请号 JP19940084715 申请日期 1994.04.22
申请人 MITSUBISHI ELECTRIC CORP;ASAHI GLASS CO LTD 发明人 HIROSE SATOSHI;NAGAYOSHI SHINSUKE;AOKI HIRONORI;NAKAGAWA NAOKI;ENDO ATSUSHI;NAKAYAMA TATSUYA
分类号 G02F1/136;G02F1/1368;H01L21/336;H01L29/78;H01L29/786;(IPC1-7):H01L29/786 主分类号 G02F1/136
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