发明名称 SOCKET FOR TESTING SEMICONDUCTOR CHIP
摘要 PURPOSE:To make it possible to achieve mass production and to secure a high reliability and a high yield rate of the mounting of a compact and economical bare chip by removing a part from an assembled plastic molded semiconductor package so as to reserve a required part as a socket. CONSTITUTION:A plastic molded semiconductor package 1 is formed by fixing a semiconductor chip 4 to a tab part 3 of a lead frame 2, connecting the semiconductor chip 4 and the lead frame 2 with a bonding wire 5, thereafter forming a resin molded part 6. The resin molded part 6 is removed from the rear surface side of the semiconductor chip 4. The tab part 3 of the lead frame 2 is removed. The semiconductor chip 4 is further removed. An edge ball part 7 of the bonding wire 5 is 5 is made to remain to serve as the electrode contact part 7 of a socket 8 for a bare chip. Therefore, the electrode 7 for the socket can be provided at a pitch so that wire bonding can be performed, and the extensive narrowing can be achieved.
申请公布号 JPH07297326(A) 申请公布日期 1995.11.10
申请号 JP19940081292 申请日期 1994.04.20
申请人 HITACHI LTD 发明人 TERADA KAZUHIRO
分类号 H01L21/66;H01L23/32 主分类号 H01L21/66
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