| 摘要 |
<p>PURPOSE:To provide a nonvolatile semiconductor memory capable of improving a detection rate of a defect incorporated in the memory having an automatic function and whose operation is not controlled from the outside. CONSTITUTION:A test mode control part 29 generates verify signals FVOK, FVNG according to a setting signal supplied from the outside at a test mode time, and sets the verify signal supplied to a control part 24 to a required state forcedly by controlling a logic circuit 27 by these verify signals FVOK, FVNG. Thus, since the number of times of retry are set regardless of the verify signal VFY outputted from a verify circuit 21, every circuits constituting the control part 24 and a counter 25 are traced, and the incorporated defect is detected surely.</p> |
