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发明名称
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TESTING METHOD FOR THE DEVICE
摘要
申请公布号
JPH07294603(A)
申请公布日期
1995.11.10
申请号
JP19940088612
申请日期
1994.04.26
申请人
FUJITSU LTD
发明人
TAKAHASHI KAZUTOSHI
分类号
G01R31/28;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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