TESTING CIRCUIT FOR LSI,申请号JP19940090884-传众专利搜索

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发明名称	TESTING CIRCUIT FOR LSI
摘要
申请公布号	JPH07294604(A)	申请公布日期	1995.11.10
申请号	JP19940090884	申请日期	1994.04.28
申请人	NEC CORP	发明人	KOBAYASHI MUNENORI
分类号	G01R31/28;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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