Interferometrical system for detecting and localising reflective defects of light guide structures.

摘要

The appts. consists of an interferometer using an incoherent light source (4), an optical coupler (6) connecting the source (4) with the light guide reflector under test (2). A mechanical support (16) for reflectors (24,40) can be displaced linearly at constant speed. A device for detecting light (26) reflected from the moving reflector (24) generates an interferogram for any reflective fault in the equipment under test. The pulse generating system (24-48) triggers sampling of the interferogram allowing identification of the location of faults in the equipment under test (2).