| 摘要 |
One preferred method for making a semiconductor structure includes altering the direction, and optionally the position, of a polycrystalline grain boundary (38) in a base layer (17,21) of an epitaxial base bipolar transistor (10). Altering the grain boundary (38) may be accomplished by annealing the semiconductor structure after the layer, which later forms the lower portion of the base (17), has been deposited. Altering the grain boundary (38) has a significant effect in reducing base resistance (Rbx1, Rbx2). Reduced base resistance (Rbx1, Rbx2) dramatically improves device performance. |
